Scanning Probe Microscopy

« all analyses SPM

Scanning Probe Microscopy (SPM) is based on a controlled scanning movement of a pointed probe in close proximity to the sample surface. The obtained three-dimensional image information includes structures and roughness down to the atomic scale as well as local material properties. While scanning tunneling microscopy (STM) is limited to electrically conductive materials, the variants of scanning force microscopy (AFM) also allow the investigation of insulator surfaces.